Defect Detection and Classification in Ceramic Plates Using Machine Vision and Naïve Bayes Classifier for Computer Aided Manufacturing

  Harpreet Singh,  Kulwinderpal Singh

The need for automated visual inspection and the methodology for solving pattern recognition problem using machine vision has been presented. This paper is describing the different applications where machine vision has been used for defect detection on curved and reflective surfaces. Different methodology for classification of defects using images also has been discussed in this paper. Different kinds of illumination systems that are used for capturing the images have been explained.

Keywords- Keywords: Machine Vision, Inspection, Defects, Gray Level, Image Series.

Unique Identification Number - IJEDR1703161
Page Number(s) - 1137-1143
Pubished in - Volume 5 | Issue 3 | September 2017
DOI (Digital Object Identifier) -   
Publisher - IJEDR (ISSN - 2321-9939)

  Harpreet Singh,  Kulwinderpal Singh,   "Defect Detection and Classification in Ceramic Plates Using Machine Vision and Naïve Bayes Classifier for Computer Aided Manufacturing", International Journal of Engineering Development and Research (IJEDR), ISSN:2321-9939, Volume.5, Issue 3, pp.1137-1143, September 2017, Available at :http://www.ijedr.org/papers/IJEDR1703161.pdf