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INTERNATIONAL JOURNAL OF ENGINEERING DEVELOPMENT AND RESEARCH
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ISSN: 2321-9939 | ESTD Year: 2013

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Paper Title
A New Approach to monitor Condition of Transformers incipient fault diagnosis based on GSM & XBEE
Authors
  Akshatha V Shetty,  Vishwanath R,  Poonam,  Shamilli,  M Thanuja

Abstract
The microcontroller has been recognized as a general purpose building block for intelligent digital system. A microcontroller is a microprocessor system build on a single chip. Major features of PIC 16f877A microcontroller are 16 bit CPU optimized for control applications, Extensive Boolean processing capabilities, On-Chip Flash program memory, On-Chip data RAM, Bi-directional and Individual Addressable I/O Lines, Multiple 16-Bit Timer/Counter, Full Duplex UART, Multiple Source/Vector/Priority Interrupt structure, On-Chip Oscillator and Clock circuitry, On-Chip EEPROM, SPI Serial Bus Interface, Watch Dog Timer. In this project, we are using one Temperature sensor, Microcontroller PIC16F877A, LCD) for displaying the faults and parameters, GSM Board and XBEE used to send the fault message to electricity board. In this project, we are using one Temperature sensor, ADC, Microcontroller 8051, LCD) for displaying the faults and parameters, GSM board used to send the fault message to electricity board. By using this project, we can detect the multiple faults of three phase transmission lines one can monitor the Temperature, Voltage, Current by means of GSM modem by sending message.

Keywords- Microcontroller, Transformer, fault detection and diagnosis, LCD, GSM, XBEE.
Publication Details
Unique Identification Number - IJEDR1502154
Page Number(s) - 875-882
Pubished in - Volume 3 | Issue 2 | May 2015
DOI (Digital Object Identifier) -   
Publisher - IJEDR (ISSN - 2321-9939)
Cite this Article
  Akshatha V Shetty,  Vishwanath R,  Poonam,  Shamilli,  M Thanuja,   "A New Approach to monitor Condition of Transformers incipient fault diagnosis based on GSM & XBEE", International Journal of Engineering Development and Research (IJEDR), ISSN:2321-9939, Volume.3, Issue 2, pp.875-882, May 2015, Available at :http://www.ijedr.org/papers/IJEDR1502154.pdf
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